A novel DFT architecture for 3DIC test, diagnosis and repair - researchr publication authors

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Mincent Lee, Saman Adham, Min-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Hao Chen. A novel DFT architecture for 3DIC test, diagnosis and repair. In Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014, Hsinchu, Taiwan, April 28-30, 2014. pages 1-4, IEEE, 2014. [doi]

This author has not been identified. Look up 'Mincent Lee' in GoogleThis author has not been identified. Look up 'Saman Adham' in GoogleThis author has not been identified. Look up 'Min-Jer Wang' in GoogleThis author has not been identified. Look up 'Ching-Nen Peng' in GoogleThis author has not been identified. Look up 'Hung-Chih Lin' in GoogleThis author has not been identified. Look up 'Sen-Kuei Hsu' in GoogleThis author has not been identified. It may be one of the following persons:

Hao Chen

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