A novel DFT architecture for 3DIC test, diagnosis and repair

Mincent Lee, Saman Adham, Min-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Hao Chen. A novel DFT architecture for 3DIC test, diagnosis and repair. In Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014, Hsinchu, Taiwan, April 28-30, 2014. pages 1-4, IEEE, 2014. [doi]

@inproceedings{LeeAWPLHC14,
  title = {A novel DFT architecture for 3DIC test, diagnosis and repair},
  author = {Mincent Lee and Saman Adham and Min-Jer Wang and Ching-Nen Peng and Hung-Chih Lin and Sen-Kuei Hsu and Hao Chen},
  year = {2014},
  doi = {10.1109/VLSI-DAT.2014.6834879},
  url = {http://dx.doi.org/10.1109/VLSI-DAT.2014.6834879},
  researchr = {https://researchr.org/publication/LeeAWPLHC14},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014, Hsinchu, Taiwan, April 28-30, 2014},
  publisher = {IEEE},
}