Cheng-Yen Lee, Kunal Bharathi, Joellen Lansford, Sunil P. Khatri. NIST-Lite: Randomness Testing of RNGs on an Energy-Constrained Platform. In 39th IEEE International Conference on Computer Design, ICCD 2021, Storrs, CT, USA, October 24-27, 2021. pages 41-48, IEEE, 2021. [doi]
Abstract is missing.