Yen-Long Lee, Soon-Jyh Chang. A quick jitter tolerance estimation technique for bang-bang CDRs. In International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017. pages 8-13, IEEE, 2017. [doi]
@inproceedings{LeeC17-39,
title = {A quick jitter tolerance estimation technique for bang-bang CDRs},
author = {Yen-Long Lee and Soon-Jyh Chang},
year = {2017},
doi = {10.1109/ITC-ASIA.2017.8097101},
url = {https://doi.org/10.1109/ITC-ASIA.2017.8097101},
researchr = {https://researchr.org/publication/LeeC17-39},
cites = {0},
citedby = {0},
pages = {8-13},
booktitle = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3051-8},
}