Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong. Fail Memory Configuration Set for RA Estimation. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-9, IEEE, 2020. [doi]
@inproceedings{LeeCKKLJ20,
title = {Fail Memory Configuration Set for RA Estimation},
author = {Hayoung Lee and Keewon Cho and Sungho Kang and Wooheon Kang and Seungtaek Lee and Woosik Jeong},
year = {2020},
doi = {10.1109/ITC44778.2020.9325273},
url = {https://doi.org/10.1109/ITC44778.2020.9325273},
researchr = {https://researchr.org/publication/LeeCKKLJ20},
cites = {0},
citedby = {0},
pages = {1-9},
booktitle = {IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9113-3},
}