Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong. Fail Memory Configuration Set for RA Estimation. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-9, IEEE, 2020. [doi]
Abstract is missing.