An efficient statistical analysis methodology and its application to high-density DRAMs

Sang-Hoon Lee, Chang-hoon Choi, Jeong-Taek Kong, Wong-Seong Lee, Jei-Hwan Yoo. An efficient statistical analysis methodology and its application to high-density DRAMs. In ICCAD. pages 678-683, 1997. [doi]

Abstract

Abstract is missing.