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Improving Cell-Aware Test for Intra-Cell Short Defects

Dong-Zhen Lee, Ying-Yen Chen, Kai-Chiang Wu, Mango C.-T. Chao. Improving Cell-Aware Test for Intra-Cell Short Defects. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 436-441, IEEE, 2022. [doi]

Authors

Dong-Zhen Lee

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Ying-Yen Chen

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Kai-Chiang Wu

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Mango C.-T. Chao

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