Dong-Zhen Lee, Ying-Yen Chen, Kai-Chiang Wu, Mango C.-T. Chao. Improving Cell-Aware Test for Intra-Cell Short Defects. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 436-441, IEEE, 2022. [doi]
@inproceedings{LeeCWC22,
title = {Improving Cell-Aware Test for Intra-Cell Short Defects},
author = {Dong-Zhen Lee and Ying-Yen Chen and Kai-Chiang Wu and Mango C.-T. Chao},
year = {2022},
doi = {10.23919/DATE54114.2022.9774502},
url = {https://doi.org/10.23919/DATE54114.2022.9774502},
researchr = {https://researchr.org/publication/LeeCWC22},
cites = {0},
citedby = {0},
pages = {436-441},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022},
editor = {Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu},
publisher = {IEEE},
isbn = {978-3-9819263-6-1},
}