Kuen-Jong Lee, Tsung-Chu Huang. An Interleaving Technique for Reducing Peak Power in Multiple-Chain Scan Circuits During Test Application. J. Electronic Testing, 18(6):627-636, 2002. [doi]
@article{LeeH02:12,
title = {An Interleaving Technique for Reducing Peak Power in Multiple-Chain Scan Circuits During Test Application},
author = {Kuen-Jong Lee and Tsung-Chu Huang},
year = {2002},
doi = {10.1023/A:1020853107381},
url = {http://dx.doi.org/10.1023/A:1020853107381},
tags = {testing},
researchr = {https://researchr.org/publication/LeeH02%3A12},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {18},
number = {6},
pages = {627-636},
}