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Kuen-Jong Lee, Tsung-Chu Huang. An Interleaving Technique for Reducing Peak Power in Multiple-Chain Scan Circuits During Test Application. J. Electronic Testing, 18(6):627-636, 2002. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Peak-power reduction for multiple-scan circuits during test applicationKuen-Jong Lee, Tsung-Chu Huang, Jih-Jeen Chen. ats 2000: 453-458 [doi] An Input Control Technique for Power Reduction in Scan Circuits During Test ApplicationTsung-Chu Huang, Kuen-Jong Lee. ats 1999: 315-320 [doi] Reduction of power consumption in scan-based circuits during testapplication by an input control techniqueTsung-Chu Huang, Kuen-Jong Lee. tcad, 20(7):911-917, 2001. [doi]
The following publications are possibly variants of this publication: