Rigorous Test Flow for PLL to Identify Weak Devices

Yi-Hsuan Lee, Shi-Yu Huang. Rigorous Test Flow for PLL to Identify Weak Devices. In IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. pages 1-6, IEEE, 2021. [doi]

Authors

Yi-Hsuan Lee

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Shi-Yu Huang

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