Yi-Hsuan Lee, Shi-Yu Huang. Rigorous Test Flow for PLL to Identify Weak Devices. In IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{LeeH21-17,
title = {Rigorous Test Flow for PLL to Identify Weak Devices},
author = {Yi-Hsuan Lee and Shi-Yu Huang},
year = {2021},
doi = {10.1109/ITC-Asia53059.2021.9808590},
url = {https://doi.org/10.1109/ITC-Asia53059.2021.9808590},
researchr = {https://researchr.org/publication/LeeH21-17},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021},
publisher = {IEEE},
isbn = {978-1-6654-1334-3},
}