Design-for-ESD-reliability for high-frequency I/O interface circuits in deep-submicron CMOS technology - researchr publication

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Jaesik Lee, Yoonjong Huh, Peter Bendix, Sung-Mo Kang. Design-for-ESD-reliability for high-frequency I/O interface circuits in deep-submicron CMOS technology. In International Symposium on Circuits and Systems (ISCAS 2001), 6-9 May 2001, Sydney, Australia. pages 746-749, IEEE, 2001. [doi]

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