Deterministic ATPG for Low Capture Power Testing

Lung-Jen Lee, Chia-Cheng He, Wang-Dauh Tseng. Deterministic ATPG for Low Capture Power Testing. In 13th International Workshop on Microprocessor Test and Verification, MTV 2012, Austin, TX, USA, December 10-13, 2012. pages 24-29, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.