Jongwon Lee, Sangkil Kim, Yoonsuk Choi, Jongwoo Park. Process Variation of Pixel Definition and Effects of Flexible OLED Luminance Degradation. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.