Youngwook Lee, Kyung Ki Kim, Yong-Bin Kim, Minsu Choi. Stochastic Edge Detection for Fine-Grained Progressive Precision. In 18th International SoC Design Conference, ISOCC 2021, Jeju Island, South Korea, Republic of, October 6-9, 2021. pages 119-120, IEEE, 2021. [doi]
Abstract is missing.