An optimal operating point by using error monitoring circuits with an error-resilient technique

Jaemin Lee, Seungwon Kim, Youngmin Kim, Seokhyeong Kang. An optimal operating point by using error monitoring circuits with an error-resilient technique. In 2015 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, South Korea, October 5-7, 2015. pages 69-73, IEEE, 2015. [doi]

@inproceedings{LeeKKK15-1,
  title = {An optimal operating point by using error monitoring circuits with an error-resilient technique},
  author = {Jaemin Lee and Seungwon Kim and Youngmin Kim and Seokhyeong Kang},
  year = {2015},
  doi = {10.1109/VLSI-SoC.2015.7314394},
  url = {http://dx.doi.org/10.1109/VLSI-SoC.2015.7314394},
  researchr = {https://researchr.org/publication/LeeKKK15-1},
  cites = {0},
  citedby = {0},
  pages = {69-73},
  booktitle = {2015 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, South Korea, October 5-7, 2015},
  publisher = {IEEE},
  isbn = {978-1-4673-9140-5},
}