Jaemin Lee, Seungwon Kim, Youngmin Kim, Seokhyeong Kang. An optimal operating point by using error monitoring circuits with an error-resilient technique. In 2015 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, South Korea, October 5-7, 2015. pages 69-73, IEEE, 2015. [doi]
@inproceedings{LeeKKK15-1, title = {An optimal operating point by using error monitoring circuits with an error-resilient technique}, author = {Jaemin Lee and Seungwon Kim and Youngmin Kim and Seokhyeong Kang}, year = {2015}, doi = {10.1109/VLSI-SoC.2015.7314394}, url = {http://dx.doi.org/10.1109/VLSI-SoC.2015.7314394}, researchr = {https://researchr.org/publication/LeeKKK15-1}, cites = {0}, citedby = {0}, pages = {69-73}, booktitle = {2015 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, South Korea, October 5-7, 2015}, publisher = {IEEE}, isbn = {978-1-4673-9140-5}, }