Jaemin Lee, Seungwon Kim, Youngmin Kim, Seokhyeong Kang. An optimal operating point by using error monitoring circuits with an error-resilient technique. In 2015 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, South Korea, October 5-7, 2015. pages 69-73, IEEE, 2015. [doi]
Abstract is missing.