Dong Uk Lee, Kyung-whan Kim, Kwan-Weon Kim, Kang Seol Lee, Sang Jin Byeon, Jin-Hee Cho, Han Ho Jin, Sang Kyun Nam, Jaejin Lee, Jun Hyun Chun, Sungjoo Hong. An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM. In Symposium on VLSI Circuits, VLSIC 2014, Digest of Technical Papers, Honolulu, HI, USA, June 10-13, 2014. pages 1-2, IEEE, 2014. [doi]
Abstract is missing.