Miky Lee, K. Kim, D. Lim, D. Cho, Ck. Han. Weibull cumulative distribution function (CDF) analysis with life expectancy endurance test result of power window switch. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 1, IEEE, 2018. [doi]
Abstract is missing.