Kwangbae Lee, Hoseung Kim, Hayun Lee, Dongkun Shin. Flexible Group-Level Pruning of Deep Neural Networks for On-Device Machine Learning. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 79-84, IEEE, 2020. [doi]
@inproceedings{LeeKLS20,
title = {Flexible Group-Level Pruning of Deep Neural Networks for On-Device Machine Learning},
author = {Kwangbae Lee and Hoseung Kim and Hayun Lee and Dongkun Shin},
year = {2020},
doi = {10.23919/DATE48585.2020.9116287},
url = {https://doi.org/10.23919/DATE48585.2020.9116287},
researchr = {https://researchr.org/publication/LeeKLS20},
cites = {0},
citedby = {0},
pages = {79-84},
booktitle = {2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020},
publisher = {IEEE},
isbn = {978-3-9819263-4-7},
}