Kwangbae Lee, Hoseung Kim, Hayun Lee, Dongkun Shin. Flexible Group-Level Pruning of Deep Neural Networks for On-Device Machine Learning. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 79-84, IEEE, 2020. [doi]
Abstract is missing.