Comparative Study on SRAMs for Suppressing Both Oxide-Tunneling Leakage and Subthreshold Leakage in Sub-70-nm Leakage Dominant VLSIs - researchr publication

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Duk-Hyung Lee, Dong-Kone Kwak, Kyeong-Sik Min. Comparative Study on SRAMs for Suppressing Both Oxide-Tunneling Leakage and Subthreshold Leakage in Sub-70-nm Leakage Dominant VLSIs. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 632-637, IEEE Computer Society, 2007. [doi]

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