Multi-Slew-Rate Output Driver and Optimized Impedance-Calibration Circuit for 66nm 3.0Gb/s/pin DRAM Interface

Dong Uk Lee, Shin-Deok Kang, Nak-Kyu Park, Hyun-Woo Lee, Young-Kyoung Choi, Jung Woo Lee, Seung-Wook Kwack, Hyeong Ouk Lee, Won-Joo Yun, Sang-Hoon Shin, Kwan-Weon Kim, Young-Jung Choi, Ye Seok Yang. Multi-Slew-Rate Output Driver and Optimized Impedance-Calibration Circuit for 66nm 3.0Gb/s/pin DRAM Interface. In 2008 IEEE International Solid-State Circuits Conference, ISSCC 2008, Digest of Technical Papers, San Francisco, CA, USA, February 3-7, 2008. pages 280-281, IEEE, 2008. [doi]

@inproceedings{LeeKPLCLKLYSKCY08,
  title = {Multi-Slew-Rate Output Driver and Optimized Impedance-Calibration Circuit for 66nm 3.0Gb/s/pin DRAM Interface},
  author = {Dong Uk Lee and Shin-Deok Kang and Nak-Kyu Park and Hyun-Woo Lee and Young-Kyoung Choi and Jung Woo Lee and Seung-Wook Kwack and Hyeong Ouk Lee and Won-Joo Yun and Sang-Hoon Shin and Kwan-Weon Kim and Young-Jung Choi and Ye Seok Yang},
  year = {2008},
  doi = {http://dx.doi.org/10.1109/ISSCC.2008.4523166},
  researchr = {https://researchr.org/publication/LeeKPLCLKLYSKCY08},
  cites = {0},
  citedby = {0},
  pages = {280-281},
  booktitle = {2008 IEEE International Solid-State Circuits Conference, ISSCC 2008, Digest of Technical Papers, San Francisco, CA, USA, February 3-7, 2008},
  publisher = {IEEE},
  isbn = {978-1-4244-2010-0},
}