Linear model of surface and scanner characterization method - researchr publication authors

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Seong-Deok Lee, Chang-Yeong Kim, Yang-Seock Seo. Linear model of surface and scanner characterization method. In Eric Walowit, editor, Device-Independent Color Imaging II, San Jose, CA, USA, February 5, 1995. Volume 2414 of SPIE Proceedings, pages 84-93, SPIE, 1995. [doi]

This author has not been identified. Look up 'Seong-Deok Lee' in GoogleThis author has not been identified. Look up 'Chang-Yeong Kim' in GoogleThis author has not been identified. Look up 'Yang-Seock Seo' in Google

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