Linear model of surface and scanner characterization method

Seong-Deok Lee, Chang-Yeong Kim, Yang-Seock Seo. Linear model of surface and scanner characterization method. In Eric Walowit, editor, Device-Independent Color Imaging II, San Jose, CA, USA, February 5, 1995. Volume 2414 of SPIE Proceedings, pages 84-93, SPIE, 1995. [doi]

Abstract

Abstract is missing.