Seong-Deok Lee, Chang-Yeong Kim, Yang-Seock Seo. Linear model of surface and scanner characterization method. In Eric Walowit, editor, Device-Independent Color Imaging II, San Jose, CA, USA, February 5, 1995. Volume 2414 of SPIE Proceedings, pages 84-93, SPIE, 1995. [doi]
@inproceedings{LeeKS95-1,
title = {Linear model of surface and scanner characterization method},
author = {Seong-Deok Lee and Chang-Yeong Kim and Yang-Seock Seo},
year = {1995},
doi = {10.1117/12.206536},
url = {http://dx.doi.org/10.1117/12.206536},
researchr = {https://researchr.org/publication/LeeKS95-1},
cites = {0},
citedby = {0},
pages = {84-93},
booktitle = {Device-Independent Color Imaging II, San Jose, CA, USA, February 5, 1995},
editor = {Eric Walowit},
volume = {2414},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {978-0-8194-1761-9},
}