Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung-Eun Seok. Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.