Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM) - researchr publication authors

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Hyunui Lee, Sukyong Kang, Hye-Seung Yu, Won-Joo Yun, Jae-Hun Jung, Sungoh Ahn, Wang-Soo Kim, Beomyong Kil, Yoo-Chang Sung, Sang-Hoon Shin, Yong Sik Park, Yong Hwan Kim, Kyung-Woo Nam, Indal Song, Kyomin Sohn, Yong-Cheol Bae, Jung Hwan Choi, Seong-Jin Jang, Gyo-Young Jin. Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM). In IEEE Asian Solid-State Circuits Conference, A-SSCC 2016, Toyama, Japan, November 7-9, 2016. pages 169-172, IEEE, 2016. [doi]

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