Hyunui Lee, Sukyong Kang, Hye-Seung Yu, Won-Joo Yun, Jae-Hun Jung, Sungoh Ahn, Wang-Soo Kim, Beomyong Kil, Yoo-Chang Sung, Sang-Hoon Shin, Yong Sik Park, Yong Hwan Kim, Kyung-Woo Nam, Indal Song, Kyomin Sohn, Yong-Cheol Bae, Jung Hwan Choi, Seong-Jin Jang, Gyo-Young Jin. Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM). In IEEE Asian Solid-State Circuits Conference, A-SSCC 2016, Toyama, Japan, November 7-9, 2016. pages 169-172, IEEE, 2016. [doi]
@inproceedings{LeeKYYJAKKSSPKN16,
title = {Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM)},
author = {Hyunui Lee and Sukyong Kang and Hye-Seung Yu and Won-Joo Yun and Jae-Hun Jung and Sungoh Ahn and Wang-Soo Kim and Beomyong Kil and Yoo-Chang Sung and Sang-Hoon Shin and Yong Sik Park and Yong Hwan Kim and Kyung-Woo Nam and Indal Song and Kyomin Sohn and Yong-Cheol Bae and Jung Hwan Choi and Seong-Jin Jang and Gyo-Young Jin},
year = {2016},
doi = {10.1109/ASSCC.2016.7844162},
url = {http://dx.doi.org/10.1109/ASSCC.2016.7844162},
researchr = {https://researchr.org/publication/LeeKYYJAKKSSPKN16},
cites = {0},
citedby = {0},
pages = {169-172},
booktitle = {IEEE Asian Solid-State Circuits Conference, A-SSCC 2016, Toyama, Japan, November 7-9, 2016},
publisher = {IEEE},
isbn = {978-1-5090-3700-1},
}