A Concise Electrothermal Model to Characterize the Thermal Safe-Operating Area of Power Transistor

Jian-Hsing Lee, Gong-Kai Lin, Chun-Chih Chen, Li-Fan Chen, Chien-Wei Wang, Shao-Chang Huang, Ching-Ho Li, Chih-Cherng Liao, Jung-Tsun Chuang, Ke-Horng Chen. A Concise Electrothermal Model to Characterize the Thermal Safe-Operating Area of Power Transistor. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

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