An injection locked PLL for power supply variation robustness using negative phase shift phenomenon of injection locked frequency divider - researchr publication

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Dongil Lee, Tae-Ho Lee, Yong Hun Kim, Young-Ju Kim 0001, Lee-Sup Kim. An injection locked PLL for power supply variation robustness using negative phase shift phenomenon of injection locked frequency divider. In 2015 IEEE Custom Integrated Circuits Conference, CICC 2015, San Jose, CA, USA, September 28-30, 2015. pages 1-4, IEEE, 2015. [doi]

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