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A lifespan-aware reliability scheme for RAID-based flash storage

Sehwan Lee, Bitna Lee, Kern Koh, Hyokyung Bahn. A lifespan-aware reliability scheme for RAID-based flash storage. In William C. Chu, W. Eric Wong, Mathew J. Palakal, Chih-Cheng Hung, editors, Proceedings of the 2011 ACM Symposium on Applied Computing (SAC), TaiChung, Taiwan, March 21 - 24, 2011. pages 374-379, ACM, 2011. [doi]

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Sehwan Lee

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Bitna Lee

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Kern Koh

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Hyokyung Bahn

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