Sehwan Lee, Bitna Lee, Kern Koh, Hyokyung Bahn. A lifespan-aware reliability scheme for RAID-based flash storage. In William C. Chu, W. Eric Wong, Mathew J. Palakal, Chih-Cheng Hung, editors, Proceedings of the 2011 ACM Symposium on Applied Computing (SAC), TaiChung, Taiwan, March 21 - 24, 2011. pages 374-379, ACM, 2011. [doi]
Abstract is missing.