Sehwan Lee, Bitna Lee, Kern Koh, Hyokyung Bahn. A lifespan-aware reliability scheme for RAID-based flash storage. In William C. Chu, W. Eric Wong, Mathew J. Palakal, Chih-Cheng Hung, editors, Proceedings of the 2011 ACM Symposium on Applied Computing (SAC), TaiChung, Taiwan, March 21 - 24, 2011. pages 374-379, ACM, 2011. [doi]
@inproceedings{LeeLKB11, title = {A lifespan-aware reliability scheme for RAID-based flash storage}, author = {Sehwan Lee and Bitna Lee and Kern Koh and Hyokyung Bahn}, year = {2011}, doi = {10.1145/1982185.1982266}, url = {http://doi.acm.org/10.1145/1982185.1982266}, tags = {rule-based, context-aware, reliability}, researchr = {https://researchr.org/publication/LeeLKB11}, cites = {0}, citedby = {0}, pages = {374-379}, booktitle = {Proceedings of the 2011 ACM Symposium on Applied Computing (SAC), TaiChung, Taiwan, March 21 - 24, 2011}, editor = {William C. Chu and W. Eric Wong and Mathew J. Palakal and Chih-Cheng Hung}, publisher = {ACM}, isbn = {978-1-4503-0113-8}, }