Jaeha Lee, Seungmin Lee, Hyeongkyu Kim, Taejun Yoo, Minjung Park, Seiseung Yoon. Pin Accessibility Improvement with Hit-Point Distribution Metrics for Sub-4nm Standard Cell. In Jürgen Becker 0001, Andrew Marshall, Tanja Harbaum, Amlan Ganguly, Fahad Siddiqui, Kieran McLaughlin, editors, 36th IEEE International System-on-Chip Conference, SOCC 2023, Santa Clara, CA, USA, September 5-8, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.