Reduced-Pin-Count BOST for Test-Cost Reduction

Youngkwang Lee, Young-Woo Lee, Sungyoul Seo, Sungho Kang. Reduced-Pin-Count BOST for Test-Cost Reduction. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(3):750-761, 2022. [doi]

Abstract

Abstract is missing.