Development of Edge-based Deep Learning Prediction Model for Defect Prediction in Manufacturing Process - researchr publication authors

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Kyung-Taek Lee, Youn-Sung Lee, Hyoseok Yoon. Development of Edge-based Deep Learning Prediction Model for Defect Prediction in Manufacturing Process. In 2019 International Conference on Information and Communication Technology Convergence, ICTC 2019, Jeju Island, Korea (South), October 16-18, 2019. pages 248-250, IEEE, 2019. [doi]

This author has not been identified. Look up 'Kyung-Taek Lee' in GoogleThis author has not been identified. Look up 'Youn-Sung Lee' in GoogleThis author has not been identified. Look up 'Hyoseok Yoon' in Google

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