Kyung-Taek Lee, Youn-Sung Lee, Hyoseok Yoon. Development of Edge-based Deep Learning Prediction Model for Defect Prediction in Manufacturing Process. In 2019 International Conference on Information and Communication Technology Convergence, ICTC 2019, Jeju Island, Korea (South), October 16-18, 2019. pages 248-250, IEEE, 2019. [doi]
Abstract is missing.