Kyung-Taek Lee, Youn-Sung Lee, Hyoseok Yoon. Development of Edge-based Deep Learning Prediction Model for Defect Prediction in Manufacturing Process. In 2019 International Conference on Information and Communication Technology Convergence, ICTC 2019, Jeju Island, Korea (South), October 16-18, 2019. pages 248-250, IEEE, 2019. [doi]
@inproceedings{LeeLY19-2,
title = {Development of Edge-based Deep Learning Prediction Model for Defect Prediction in Manufacturing Process},
author = {Kyung-Taek Lee and Youn-Sung Lee and Hyoseok Yoon},
year = {2019},
doi = {10.1109/ICTC46691.2019.8939905},
url = {https://doi.org/10.1109/ICTC46691.2019.8939905},
researchr = {https://researchr.org/publication/LeeLY19-2},
cites = {0},
citedby = {0},
pages = {248-250},
booktitle = {2019 International Conference on Information and Communication Technology Convergence, ICTC 2019, Jeju Island, Korea (South), October 16-18, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0893-3},
}