SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits

Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer. SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits. In DAC. pages 26-29, 1992. [doi]

Authors

Kuen-Jong Lee

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Charles Njinda

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Melvin A. Breuer

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