Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer. SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits. In DAC. pages 26-29, 1992. [doi]
@inproceedings{LeeNB92,
title = {SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits},
author = {Kuen-Jong Lee and Charles Njinda and Melvin A. Breuer},
year = {1992},
url = {http://portal.acm.org/citation.cfm?id=113938.113931},
tags = {testing},
researchr = {https://researchr.org/publication/LeeNB92},
cites = {0},
citedby = {0},
pages = {26-29},
booktitle = {DAC},
}