SWiTEST: a switch level test generation system for CMOS combinational circuits

Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer. SWiTEST: a switch level test generation system for CMOS combinational circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 13(5):625-637, 1994. [doi]

Abstract

Abstract is missing.