On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug

Hayoung Lee, Hyunggoy Oh, Sungho Kang. On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug. IEEE Access, 9:56443-56456, 2021. [doi]

Authors

Hayoung Lee

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Hyunggoy Oh

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Sungho Kang

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