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Hayoung Lee, Hyunggoy Oh, Sungho Kang. On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug. IEEE Access, 9:56443-56456, 2021. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: An On-Chip Error Detection Method to Reduce the Post-Silicon Debug TimeHyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang. TC, 66(1):38-44, 2017. [doi]
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