Hayoung Lee, Hyunggoy Oh, Sungho Kang. On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug. IEEE Access, 9:56443-56456, 2021. [doi]
@article{LeeOK21,
title = {On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug},
author = {Hayoung Lee and Hyunggoy Oh and Sungho Kang},
year = {2021},
doi = {10.1109/ACCESS.2021.3071517},
url = {https://doi.org/10.1109/ACCESS.2021.3071517},
researchr = {https://researchr.org/publication/LeeOK21},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {9},
pages = {56443-56456},
}