2 Pipelined ADC with On-Chip Digital Self-Calibration

Ho-Young Lee, Tae-Hwan Oh, Ho-Jin Park, Hae-Seung Lee, Mark Spaeth, Jae-Whui Kim. 2 Pipelined ADC with On-Chip Digital Self-Calibration. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 313-316, IEEE, 2007. [doi]

Authors

Ho-Young Lee

This author has not been identified. Look up 'Ho-Young Lee' in Google

Tae-Hwan Oh

This author has not been identified. Look up 'Tae-Hwan Oh' in Google

Ho-Jin Park

This author has not been identified. Look up 'Ho-Jin Park' in Google

Hae-Seung Lee

This author has not been identified. Look up 'Hae-Seung Lee' in Google

Mark Spaeth

This author has not been identified. Look up 'Mark Spaeth' in Google

Jae-Whui Kim

This author has not been identified. Look up 'Jae-Whui Kim' in Google