Direct and indirect measurement of inter-cell capacitance in NAND flash memory

Dong-hwan Lee, Wonyong Sung. Direct and indirect measurement of inter-cell capacitance in NAND flash memory. In 2014 IEEE Workshop on Signal Processing Systems, SiPS 2014, Belfast, United Kingdom, October 20-22, 2014. pages 151-156, IEEE, 2014. [doi]

@inproceedings{LeeS14-23,
  title = {Direct and indirect measurement of inter-cell capacitance in NAND flash memory},
  author = {Dong-hwan Lee and Wonyong Sung},
  year = {2014},
  doi = {10.1109/SiPS.2014.6986078},
  url = {http://dx.doi.org/10.1109/SiPS.2014.6986078},
  researchr = {https://researchr.org/publication/LeeS14-23},
  cites = {0},
  citedby = {0},
  pages = {151-156},
  booktitle = {2014 IEEE Workshop on Signal Processing Systems, SiPS 2014, Belfast, United Kingdom, October 20-22, 2014},
  publisher = {IEEE},
  isbn = {978-14799-6588-5},
}