Reliable Edge Intelligence in Unreliable Environment

Minah Lee, Xueyuan She, Biswadeep Chakraborty, Saurabh Dash, Burhan Ahmad Mudassar, Saibal Mukhopadhyay. Reliable Edge Intelligence in Unreliable Environment. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 896-901, IEEE, 2021. [doi]

Abstract

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